Best Paper Award for D. Nikolos & Th. Haniotakis

Best paper award of 3rd IEEE International Symposium on Quality Electronic Design (ISQED' 03) San Jose, CA, USA, March 18-20, 2002
Paper's Title: "Extending the Viability of IDDQ Testing in the Deep Submicron Era"
Authors: Y. Tsiatouhas, Th. Haniotakis, D. Nikolos, A. Arapoyanni

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