Citations

1. "A Design Method for Embedded Self-Testing t-UED and BUED Code Checkers", S. Tarnick,  IEEE Int. On-Line Testing Symposium, pp. 43-48, 7-9 July 2003.
2. "Design of Embedded Self-Testing Checkers for t-UED and BUED Codes", Steffen Tarnick, Journal of Electronic Testing: Theory and Applications, pp. 465-477, vol. 20, No 5, 2004.
3. "Design of FSM with Concurrent Error Detection Based on Viterbi Decoding", Ming Li, Shiyi Xu, Enjun Xia, Fayu Wan, 17th IEEE Asian Test Symposium, 24-27 Nov. 2008 Page(s):383 - 388