Citations

  1. "General Design Method for VLSI High Speed Berger Code Checkers", C. Metra and J. C. Lo, Proc. of IEEE Int. On-Line Testing Workshop, pp.177-181, 1998.
  2. "Weight-Based Codes and Their Application to Concurrent Error Detection of Multilevel Circuits", D. Das and N. A. Touba, IEEE VLSI Test Symposium, pp. 370-376, Dana Point , California, April 25-29, 1999.
  3. "Programmable Embedded Self-Testing Checkers for All-Unidirectional Error-Detecting Codes", A. Stroele and S. Tarnick, IEEE VLSI Test Symposium, pp. 361-369, Dana Point , California, April 25-29, 1999.
  4. "Intermediacy Prediction for High Speed Berger Code Checkers", C. Metra, J. -C. Lo, Journal of Electronic Testing: Theory and Applications, pp. 607-615, 16, 2000.
  5. "Lowering Power Consumption in Concurrent Checkers via Input Ordering", Kartik Mohanram and Nur A. Touba, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Vol. 12, No. 11, November 2004, pp. 1234-1243.
  6. "Single-Output Embedded Checkers for Systematic Unordered Codes", S. Tarnick, Proc. of IEEE International On-Line Testing Symposium, pp. 45-51, 2004
  7. "Single and Double-Output Embedded Checker Architectures for Systematic Unordered Codes", S. Tarnick, Journal of Electronic Testing: Theory and Applications, Vol. 21 No 4 Aug. 2005, pp. 391-404
  8. "Reliability and Test of High-Performance Integrated Circuits", Kartik Mohanram, B. Tech., PHD Dissertation, University of Texas at Austin
  9. "Berger Code-Based Concurrent Error Detection in Asynchronous Burst-Mode Machines", S. Almukhaizim and Y. Makris, in Proc. of Design Automation and Test in Europe, 2006, p. 71.
  10. "Simultaneous Reduction in Test Data Vol-ume and Test Time for TRC-Reseeding", B. Zhou, Y.-Z. Ye and Y.-S. Wang, Proc. of ACM Great Lakes Sympo-sium on VLSI, March 2007, pp. 49-54.
  11. On the Selection of Unidirectional Error Detecting Codes for Self-Checking Circuits' Area Overhead and Performance Optimization", M. Omana, O. Losco, C. Metra, A. Pagni, Proc. of IEEE International On-Line Testing Symposium, pp. 163-168, 2005