Citations

        1. Combinatorial Methods for the Evaluation of Yield and Operational Reliability of Fault-Tolerant Systems-On-Chip, J. A. Carrasco and V. Sune, Microelectronics Reliability, Vol. 44, No. 2, February 2004, pp. 339-350.
        2. A Cache Architecture for Extremely Unreliable Nanotechnologies, G. R. Roelke, R. O. Baldwin, B. E. Mullins and Y. C. Kim, IEEE Transactions on Reliability, Vol. 56, No. 2, June 2007, pp. 182-197.
        3. Computationally Efficient Active Rule Detection Method: Algorithm and Architecture, H. Mahdi, R. H. Mahdiani, S. Ahmad, F. M. Sied and L. Caro, Fuzzy Sets and Systems, Vol. 160, No. 4, 16 February 2009, pp. 554-568.
        4. An ROBDD-based Combinatorial Method for the Evaluation of Yield of Defect-Tolerant Systems-On-Chip, J. A. Carrasco, and V. Sune, IEEE Transactions on VLSI Systems, Vol. 17, No. 2, February 2009, pp. 207-220.
        5. A Combinatorial Method for the Evaluation of Yield of Fault-Tolerant Systems-On-Chip, D. P. Munteanu, V. Sune, R. Rodriguez-Montanes, and J. A. Carrasco, 2003 IEEE International Conference on Dependable Systems and Networks, June 22-25, 2003, San Francisco, California, USA, pp. 563-572.
        6. Non-FPGA-Based Field-Programmable Self-Repairable (FPSR) Microarchitecture, Y.-K. Jung, NASA/ESA Conference on Adaptive Hardware and Systems (AHS'08), June 22-25, 2008, Noordwijk, The Netherlands, pp. 93-100.