Citations

1. "MCBIST: A New On-Line BIST Scheme," M. Alisafaee, P. Lotfikamran, S. Shamshiri, H. Esmaeilzadeh and Z. Navabi, in Proc. of IEEE 5th Workshop on RTL and High Level Testing (WRTLT'04), Osaka, Japan, pp. 85-90, Nov. 2004
2. "RT level reliability enhancement by constructing dynamic TMRS", N Karimi, S Mirkhani, Z Navabi, F Lombardi, Proceedings of the 17th great lakes symposium on VLSI, pp. 172 - 175, 2007.
3. "ESTA: An Efficient Method for Reliability Enhancement of RT-Level Designs," Naghmeh Karimi, Shahrzad Mirkhani, Zainalabedin Navabi, ats, pp. 195-202,  15th Asian Test Symposium (ATS'06),  2006