Citations

1. "Effective BIST scheme for Booth Multipliers", D. Gizopoulos, A. Paschalis and Y. Zorian, International Test Conference 1995, Washington DC., USA, pp. 824-833.
2. "On Testable Multipliers for Fixed-Width Data Path Architectures", N. Mukherjee, J. Rajski, and J. Tyszer, Int. Conf. on Computer Aided Design-ICCAD, November 5-9 San-Jose, California, 1995.
3. "Testing Trees for Multiple Faults", A. Vergis, Proc. 14th IEEE VLSI Test Symposium, April 28-May 1, 1996, Princeton, USA, pp. 44-449.
4. " Design of Testable Multipliers for Fixed-Width Data Paths, N. Mukherjee, J.  Rajski and J. Tyszer, IEEE Trans. On Comput. ,1997, Vol 46, Iss 7, pp. 795-810.
5. "Design of C-testable Multipliers Based on the Modified Booth Algorithm", K. O. Boateng, H. Takahashi and Y. Takamatsu, in Proc. of the IEEE Asian Test Symposium 1997, Nov. 1997, pp. 42-47.
6. "Built-In self tests for large multiplier, adder, or subtructor", Fazal U. R., Qureshi, Cupertino, Calif., USA Patent, Patent number 5.600.658, Feb. 4, 1997.