Citations

1. "Radiation Induced Single-Word Multiple-Bit Upsets Correction in SRAM", B. Gill, M. Nicolaidis, and C. Papachristou, IEEE Int. On-Line Testing Symposium, pp. 266-271, 2005.
2. "Energy Efficient Soft Error-Tolerant Digital Signal Processing", B. Shim, and N.R. Shanbhag, IEEE Transactions on VLSI Systems, vol. 14, no. 4, pp. 336-348, 2006.
3. "A Built-In Self Test Scheme for Soft Error Rate Characterization", A. Sanyal, S. Alam and S. Kundu, 14th IEEE Int. On-Line Testing Symposium (IOLTS), pp. 65-70, 2008.
4.  "Design and Analysis Methodologies to Reduce Soft Errors in Nanometer VLSI Circuits", Balkaran Singh Gill, Case Western Reserve University (USA), Ph.D. Thesis, Jun. 2006.
5. "Scheduling and Optimization of Fault-Tolerant Distributed Embedded Systems", Viacheslav Izosimov, Linkoping University (Sweden), Ph.D. Thesis, 2009.