Citations

1. "High Performance BICS Design for IDDQ Testing Applications", C-L. Hsu and M-H Ho, IEEE Conference on Electron Devices and Solid-State Circuits (EDSSC), pp. 801-804, 2007.
2. "Novel Built-In Current-Sensor-Based I-DDQ Testing Scheme for CMOS Integrated Circuits", C-L. Hsu, M-H Ho and C-F. Lin, IEEE Transactions on Instrumentation and Measurement, vol. 58, no.7, pp. 2196-2208, 2009.