Citations

1. "Scan-Chain Partition for High Test-Data Compressibility and Low Shift Power Under Routing Constraint", Wang, S.-J.; Li, K. S.-M.; Chen, S.-C.; Shiu, H.-Y.; Chu, Y.-L.; IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Volume 28,  Issue 5,  May 2009 Page(s):716 - 727.
2. "Efficient Test Pattern Compression Techniques Based on Complementary Huffman Coding", Shyue-Kung Lu, Hei-Ming Chuang, Guan-Ying Lai, Bi-Ting Lai, Ya-Chen Huang, IEEE Circuits and Systems International Conference on Testing and Diagnosis, ICTD,  28-29 April 2009 Page(s):1 - 4