Citations

1. "Efficient Deterministic Test Generation for BIST schemes with LFSR Reseeding", S. Neophytou, M. K. Michael, S. Tragoudas, in Proc. IEEE International On-Line Testing Symposium, pp. 43-48
2. "A New Test Data Compression Scheme for Multi-scan Designs", Teng Lin, Jianhua Feng, Yangyuan Wang, IEEE Computer Society Annual Symposium on VLSI, 2007, pp. 179-185.
3. "LFSR Reseeding with Irreducible Polynomials" Snehal Udar, Dimitri Kagaris, Proc. of 13th IEEE International On-Line Testing Symposium, 2007
4. "Deterministic Built-in TPG with Segmented FSMs", Sudireddy S., Kakade J., Kagaris D., 14th IEEE International On-Line Testing Symposium, 7-9 July 2008 Page(s):261 - 266
5. "Deviation Based LFSR Reseeding for Test-Data Compression", Zhanglei Wang, Hongxia Fang, Krishnendu Chakrabarty and Michael Bienek, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 28, no. 2, Febr. 2009, pp. 259-271
6. "Design techniques and tradeoffs in implementing non-destructive field test using logic BIST self-test", Amit Dutta, Malav Shah, G. Swathi; A. Rubin, 15th IEEE International On-Line Testing Symposium, 24-26 June 2009 Page(s):237 - 242