Citations

1. "Minimal C-testable tests for block-CLA adders", Moore W. R. International Journal of Electronics, Volume 85, Number 5, 1 November 1998 , pp. 611-628.
2. "Test pattern generation for column compression multiplier", Pingying Zeng,   Zhigang Mao,   Yizheng Ye,   Yuliang Deng, Proceedings of Seventh Asian , 2-4 Dec. 1998, pp. 500-503.
3. "Accumulator-based pseudo-exhaustive two-pattern generation", I. Voyiatzis,  Journal of Systems Architecture, Volume 53, Issue 11, November 2007, pp. 846-860.