Citations

    1. "ÄIDDQ Testing of CMOS Data Converters", S. Yellampalli and A. Srivastava, Journal of Active and Passive Electronic Devices, vol. 4, no. 1-4, pp. 63-89, 2009.
    2. "Quiescent Current Testing of CMOS Data Converters", Siva Yellampalli, Louisiana State University (USA), Ph.D. Thesis, Dec. 2008.