Citations

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        15. An ROBDD-based Combinatorial Method for the Evaluation of Yield of Defect-Tolerant Systems-On-Chip, J. A. Carrasco, and V. Sune, IEEE Transactions on VLSI Systems, Vol. 17, No. 2, February 2009, pp. 207-220.
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        29. On the modulo 2n+1 multiplication for diminished-1 operands, C. Efstathiou, I. Voyiatzis and N. Sklavos, 2008 International Conference on Signals, Circuits and Systems, November 7-9, Hammamet, Tunisia, pp. 1-5.