Citations

1. "A High Compression and Short Test Sequence Test Compression Technique to Enhance Compressions of LFSR Reseeding", Seongmoon Wang, Wenlong Wei, Srimat T. Chakradhar, Proc. of  IEEE Asian Test Symposium, 2007, pp. 79-86
2. "An efficient test-data compaction for low power VLSI testing", Po-Han Wu, Tsung-Tang Chen, Wei-Lin Li, Jiann-Chyi Rau, IEEE International Conference on Electro/Information Technology, 18-20 May 2008 Page(s):237 - 241
3. "Reconfigurable broadcast scan compression using relaxation-based test vector decomposition", A.H. El-Maleh M.I. Ali A.A. Al-Yamani, IET Computer Digital Techniques, 2009, Vol. 3, Iss. 2, pp. 143-161
4. "Survey of Test Data Compression Techniques Emphasizing Code Based Schemes", Usha Sandeep Mehta, K. S. Dasgupta, N. M. Devashrayee, 12th Euromicro Conference on Digital System Design, 27-29 August, 2009