Citations

    1. "Semiconductor Test Strategies", J.A. Ochoa and J.R. Portet, IEEE Instrumentation and Measurement Magazine, vol. 6, no. 1, pp. 20-25, 2003.
    2.  "ÄIDDQ Based Testing of Submicron CMOS Digital-to-Analog Converter Circuits", S. Yellampalli and A. Srivastava, Journal of Active and Passive Electronic Devices, vol. 3, no. 3-4, pp. 341-353, 2008.
    3. "ÄIDDQ Testing of CMOS Data Converters", S. Yellampalli and A. Srivastava, Journal of Active and Passive Electronic Devices, vol. 4, no. 1-4, pp. 63-89, 2009.
    4. "Quiescent Current Testing of CMOS Data Converters", Siva Yellampalli, Louisiana State University (USA), Ph.D. Thesis, Dec. 2008.